Armstrong Optical Ltd

Address:
31 Caxton House
Northampton Science Park
Kings Park Road
Northampton
NN3 6LG
United Kingdom

Phone: 01604 654220

Fax: 01604 654221

Web: http://www.armstrongoptical.co.uk


Armstrong Optical Ltd articles

Displaying 1 - 20 of 29

Interferometer targets machine tool calibration

Interferometer targets machine tool calibration
The new SP1500 C interferometer from SIOS Messtechnik are now available in the UK through Armstrong Optical. The instrument enables synchronous and continuous measurements with 5 degrees of freedom (DOF) for the calibration of linear slides with resolution of <0.1 nm displacement, <0.01 arcsec angular (<50 nRads), and <10 nm straightness.
11th August 2015

Sensor measures plastics parameters quickly & easily

Sensor measures plastics parameters quickly & easily
A common feature of modern automated plastic production facilities is the dimension measuring of containers, performs or films made of clear or opaque plastic. Armstrong Optical has simplified this process with the introduction of the CHRocodile K sensor system from Precitec Optronik.  
19th August 2014

New ultra-high resolution thermography camera

New ultra-high resolution thermography camera
For the first time a thermographic camera with a 1024 x 768 pixel sensor array has been introduced to the market by InfraTec GmbH of Dresden, Germany. The new VarioCAM HD range, available in the UK from Armstrong Optical Ltd., delivers over 2.5 times more spatial resolution than the VarioCAM hr camera range, which when coupled with a thermal resolution of less than 0.03°C and temperature measurment range of -40°C to +1200°C allows the professional thermographer to operate with unprecedented capability and efficiency in an extensive range of scenarios.
15th June 2012


High performance Optical timing reference source

High performance Optical timing reference source
Armstrong Optical Ltd., has expanded its range of optical timing reference sources with the introduction of the FLP – Fibre Laser Pulser.
25th July 2011

Non Contact IR Wafer thickness measurement

Non Contact IR Wafer thickness measurement
In-process measurement of the thickness of Silicon wafer substrates and blind via depth is a regular operation in semiconductor manufacturing. Armstrong Optical Ltd of Northampton have added high precision, non contact sensor that allows thickness measurement of Silicon (and other semiconductor substrates) wafers (doped or undoped).
11th July 2011

High speed thermal cameras for Machine vision and process control

High speed thermal cameras for Machine vision and process control
The ImageIR® range of thermography cameras from InfraTec Gmbh and supplied by Armstrong Optical offer non destructive active thermography testing, process monitoring and control with frame rates of up to 3 KHz across the infrared spectrum (0.8 to 12microns). Operating in line-scan mode rates of 10 KHz can be achieved.
7th June 2011

Sydor Optics Completes First Half of $4M Expansion to Meet Increasing Customer Demands

Sydor Optics Completes First Half of $4M Expansion to Meet Increasing Customer Demands
Sydor Optics, a manufacturer of flat glass optics, has just completed the first half of its acquisition of $4M in double-sided polishing and metrology equipment with the second half of expansion to be completed within the next six months. This investment, coupled with Sydor’s continuous investment in team development and process improvement, allows them to continue their growth while handling their customers’ increasing volume and size demands.
18th October 2010

Ultra-high resolution thermography

Ultra-high resolution thermography
There is much activity in the world thermography market with the advent of toy systems available for ultra-low prices, but delivering ultra-low capabilities. Armstrong Optical Ltd of Northampton has benefited from sales at the bottom-end of an expanding market but is now extending its product offering beyond the top-end by introducing the VarioCAM® range of cameras from InfraTec GmbH of Dresden.
13th September 2010

Easier thermography with the EasIR range

Easier thermography with the EasIR range
The EasIR range of handheld thermography cameras from Armstrong Optical Ltd of Northampton have been introduced to the market to provide a solution to all thermal measurement requirements. The range are extremely easy to understand and operate and have been designed for both entry-level and expert users.
9th July 2010

Microscopic vibrations measured

Microscopic vibrations measured
In order to augment the existing range of non-contact vibration analysis instruments Armstrong Optical Ltd have added the new laser microscope vibrometer from SIOS Meβtechnik GmbH to their product portfolio. The Nano Vibration Analyser is a fibre-coupled laser interferometric vibrometer integrated into a precision technical microscope designed for dynamic studies of micro structures, MEMS and cantilevers.
26th May 2010

No Blind Spots With N-Driver

No Blind Spots With N-Driver
The new N-Driver system from Armstrong Optical Ltd is a major leap forward in road and rail safety allowing increased driver visibility under all weather and lighting conditions. N-Driver is an easily installed thermal imaging system offering features such as optimum resolution, fast frame-rate and excellent field of view and can act as a drivers third eye enhancing the driving experience.
4th May 2010

Armstrong To Display Thermography Cameras At Photonex

Armstrong To Display Thermography Cameras At Photonex
Armstrong Optical Limited will show new products from its range of optical metrology systems and optical components at Photonex 2009, to be held on 14-15 October at Stoneleigh Exhibition Halls, Coventry.
24th September 2009

Brand new non-contact Surface Profiling Controller

Brand new non-contact Surface Profiling Controller
Armstrong Optical Ltd, in keeping with being at the cutting edge of non-contact surface profiling technology, is pleased to announce the release a new optical controller to operate in conjunction with the Precitec Optronik GmbH range of non-contact surface profiling and thickness measurement systems.
24th September 2009

New product Catalogue - Steinmeyer FMD

New product Catalogue - Steinmeyer FMD
Now available from Armstrong Optical UK Ltd is the new 99 page, 2009 Steinmeyer FMD precision motion systems brochure, with over 35 different translation stage formats with hundreds of different configurations and options making the Steinmeyer stages suitable for almost all movement applications. Included are details on the dual drive stages which incorporate a DC motor for high speeds of up to 120 mm/sec and a piezo motor for high accuracy applications.
3rd April 2009

Testing times for the infrared

Testing times for the infrared
The RAD-900 Infrared Radiometer, manufactured by Optikos Corp of the USA and distributed by Armstrong Optical Ltd allows users to make precise measurements of radiometric temperature and spectral radiance. The system operates in the both the MWIR and LWIR bands and may be used to carry out both 1D and 2D source radiance measurements when installed on the ASB-920 Angular Scan Base.
9th March 2009

Shields for ORION

Shields for ORION
Armstrong Optical Ltd and Sydor Optics Inc have been awarded a major contract to supply optical debris shields for the Atomic Weapons Establishment’s replacement high-energy laser facility, Project Orion.
20th February 2009

Cameras for infrared interferometry from Armstrong Optical

Cameras for infrared interferometry from Armstrong Optical
With the greater use of thermal imaging in military, homeland defence, security and surveillance applications the need to test infrared lens systems to ensure that they meet demanding specifications has never been more widespread. One of the easiest and most diagnostic lens testing techniques in use is interferometry and Armstrong Optical Ltd now have the capability to offer camera systems for all the common infrared wavebands.
9th January 2009

Blind via measurement in Si and GaAs

Blind via measurement in Si and GaAs
With semiconductor devices becoming smaller and smaller and between-level interconnects requiring the production of blind vias with high aspect ratios there is a need to be able to perform measurements on such features.
26th November 2008

Non-contact medical device measurement

Non-contact medical device measurement
The high-precision, non-contact measurement of medical devices can now be made with a single probe enabled by the optical sensors CHRocodile E, X or IT available from Armstrong Optical Ltd, the UK representatives of Precitec Optronik GmbH.
19th November 2008

Glass measurement made easy

Glass measurement made easy
When a major European glass container manufacturer needed a production line method to measure the dimensions of their glass bottles and containers they turned to Precitec Optronik GmbH of Germany and their UK representative Armstrong Optical Ltd. Although the manufacturer was already using an ultrasonic method it was not reliable enough, too intrusive and too slow for the required line speeds.
3rd October 2008


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