Microscopic vibrations measured

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26th May 2010

Source: Armstrong Optical Ltd

In order to augment the existing range of non-contact vibration analysis instruments Armstrong Optical Ltd have added the new laser microscope vibrometer from SIOS Meβtechnik GmbH to their product portfolio. The Nano Vibration Analyser is a fibre-coupled laser interferometric vibrometer integrated into a precision technical microscope designed for dynamic studies of micro structures, MEMS and cantilevers.

Flexible sample positioning is achieved with a 50x50mm X/Y translation stage and the vibrating object can also be viewed on a PC by means of a USB camera. DC deflection measurements as well as spectral analysis up to a frequency of 2 MHz are possible. Amplitudes can be measured with sub-nanometre resolution. The control software controls scans and displays results of the FFT transform and allows data storage and export.

This Nano Vibration Analyser is set to become an essential in any MEMS or microstructure lab as it allow the determination of vibrational spectra and shapes and resonant frequencies using non contact technology,

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