Multitest Introduces Contactors for ICs with Differential Signals: Best Configurations Derived from 3-D Electromagnetic Simulation

Contactors for differential signal devices must provide the most transparent interconnect possible in order to minimize the degradation of high-speed signals between the test system and the DUT. The test interface of a DUT with differential signals requires careful contactor design to accommodate the special requirements of differential signals. This is accomplished by matching the characteristic impedance of the board and contactor as closely as possible to the tester electronics and the device.

Multitest has determined that the best configurations are derived from 3-D electromagnetic simulation software and lab-correlated data. These tools allow experimentation and optimization of the contactor properties to aid in the selection of optimum contactor configuration. This is how Multitest responds to the ever-increasing data rates of semiconductor devices that require that the test interface from the tester to the DUT be carefully designed to maintain signal integrity.

Many of today’s semiconductors transfer large amounts of data from one device to another in a serial format at very high data rates. Differential signals reduce signal amplitudes, increase speeds, reduce I/O counts and provide improved immunity to external noise. These features lead to both size and power reductions for consumer products such as cell phones and laptops.