Multitest elektronische Systeme GmbH

Address:
Aeussere Oberaustrasse 4

83026 Rosenheim
Germany

Phone: +49-(0)8031-406 0

Fax: +49-(0)8031-426 81

Web: www.multitest.com


Multitest elektronische Systeme GmbH articles

Displaying 1 - 19 of 19

Sensor test solution passed for automotive applications

Sensor test solution passed for automotive applications
Having successfully passed all correlation tests on a customer test floor Multitest’s new InPressure HD system has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field-proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.
11th May 2017

Gas measurement added to environmental sensor test system

Gas measurement added to environmental sensor test system
The first InHumid test system supplied by Multitest for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume, single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.
16th August 2016

Multitest Develops Innovative LCR Concept for Cost Efficient, High-Performance Test Interface Boards

Multitest Develops Innovative LCR Concept for Cost Efficient, High-Performance Test Interface Boards
Multitest’s board division has successfully introduced a new LCR (layer count reduction) concept for high pin count BGA applications. Board customers now will benefit from significant cost savings without sacrificing performance. With the new LCR concept, the layer count of standard pitch BGA boards can be reduced by up to 40 percent.
25th November 2010


Multitest’s DURA® Kelvin Recognized with a 2010 Global Technology Award

Multitest’s DURA® Kelvin Recognized with a 2010 Global Technology Award
Multitest announces that it has been awarded a Global Technology Award in the category of Components for its DURA® Kelvin™. The award was presented to the company during a Tuesday, October 26, 2010 ceremony that took place during SMTA International at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.
4th November 2010

Multitest Offers Test Interface Simulation for Optimized, Cost-Efficient Test Interfaces

Multitest Offers Test Interface Simulation for Optimized, Cost-Efficient Test Interfaces
Multitest now offers Test Interface Simulation to optimize test interfaces. Signal Integrity Simulation is valuable in understanding the performance of the test interface. It is an important multi-purpose tool used for the continuous improvement of design standards, verification of existing designs and optimization of new designs. Signal Integrity Simulation provides cost-efficient PCB layouts and ensures optimum overall test interfaces. Depending on the need, dedicated simulations may be applied to guarantee the best performance at a low cost.
14th October 2010

Multitest’s MT9510 Reaches Record-Breaking Order Numbers

Multitest’s MT9510 Reaches Record-Breaking Order Numbers
Multitest announces record-breaking annual order numbers for its MT9510 tri-temp pick-and-place handler. The demand is driven primarily by automotive customers worldwide.
12th October 2010

Multitest Releases Plug & Yield™ Solution

Multitest Releases Plug & Yield™ Solution
Multitest announces that its new Plug & Yield™ provides significant cost and time savings by enabling users to bring products to market faster and at the lowest possible cost. This highly demanding process includes better resource utilization and a faster “time to yield.” Additionally, the Plug & Yield™ solution provides better production test yields and an effective, long-term test technology partnership.
7th October 2010

Wafer-Scale Contactors Using Multitest Mercury Probes Successfully Deployed to Subcontractors in Asia

Wafer-Scale Contactors Using Multitest Mercury Probes Successfully Deployed to Subcontractors in Asia
Multitest announces that one of the world’s largest fab-less semiconductor manufacturers has evaluated Mercury-based wafer-scale contactors and found them superior to its previous traditional, POGO-style spring pin solution. Multitest’s wafer-scale contactors provide up to a six percent yield improvement over traditional spring pin contactors with eight sites and nearly 200 spring probes per site. More than 30 contactors have been purchased to support increasing production volumes.
22nd September 2010

Committed to Quality, Standards and Ethics: Multitest Renews ISO 9001/14001 Certification

Multitest announces that it has successfully passed the annual audit for its ISO 9001 quality management and ISO 14001 environmental certifications for the 10th consecutive year.
6th September 2010

Multitest Introduces Contactors for ICs with Differential Signals: Best Configurations Derived from 3-D Electromagnetic Simulation

Multitest announces that it has designed differential contactors that are customized for each semiconductor test application. The selection of the contactor materials and probes are optimized for the desired impedance.
4th August 2010

Multitest Introduces Superior Spare Support: S3 Program for the Most Effective Spare Parts Administration and Logistics

Multitest has expanded the portfolio of its Singapore spare parts distribution center for pogo pin-based contactors. With this step, all major spare parts for test handlers and contactors now are available for fast delivery to Asian test sites.
7th July 2010

Multitest Named One of “THE BEST Chip Making Equipment Suppliers for 2010” by VLSIresearch Inc.

Multitest Named One of “THE BEST Chip Making Equipment Suppliers for 2010” by VLSIresearch Inc.
Multitest announces that it has once again been named one of the top ten chip making equipment suppliers in the annual Customer Satisfaction Survey conducted by VLSIresearch. The annual survey is conducted globally and provides industry-wide feedback on overall company performance.
6th July 2010

Multitest’s Bernhard Lorenz to Present at SEMICON West 2010

Multitest’s Bernhard Lorenz to Present at SEMICON West 2010
Multitest, announces that Bernhard Lorenz, Director of Engineering, will present a paper titled “Test in Carriers - The New Test Solution” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco. The presentation will be held during TechSITE’s Test Challenges session on Wednesday, July 14, 2010 from 10:50-11:10 a.m. in the North Hall.
24th June 2010

Multitest’s Günther Jeserer to Present at SEMICON West 2010

Multitest’s Günther Jeserer to Present at SEMICON West 2010
Multitest, announces that Günther Jeserer, Business Unit Manager, will present a paper titled “Improved Cost of Test by Optimized Tester Utilization” at the upcoming SEMICON West exhibition, scheduled to take place July 13-15, 2010 at the Moscone Center in San Francisco. The presentation will be held during TechSITE’s Test Challenges session on Tuesday, July 13, 2010 from 12:10-12:30 p.m. in the North Hall.
22nd June 2010

Multitest Introduces MEMS Solution for Pressure Sensors

Multitest Introduces MEMS Solution for Pressure Sensors
Mulitest’s concept for MEMS test and calibration equipment continues for pressure sensors. Common applications include all types of pressure monitoring, e.g. altitude meters, tire pressure control, differential pressure sensors, and various medical and industrial devices.
10th June 2010

Increase ATE Load Board Life: Multitest’s Mercury® Contactors Minimize Pad Wear

Increase ATE Load Board Life:  Multitest’s Mercury® Contactors Minimize Pad Wear
Multitest’s ECT Interface Product Division conducted a study to analyze the effects of spring probes on load board pads. In the high-volume production testing of semiconductors, test cell cost and reliability are very important to control. ATE load boards are critical test cell components and test contactors must not damage the load board pads. Multitest’s flat-technology Mercury® contactors virtually eliminate PCB pad damage.
4th June 2010

Multitest Launches Multi-site Testing for High Pin Count Devices: MT9510 Pressure Booster

Multitest Launches Multi-site Testing for High Pin Count Devices: MT9510 Pressure Booster
For high pin count devices, the capability of multi-site testing generally is limited by the required contacting force. Additionally, there are even complex, integrated ICs with an extremely high pin count for which even single site testing is critical because of too little contact force. The well-established tri-temp pick-and-place handler, MT9510XP, now offers an option to substantially increase the contact force. This new feature enables users to test even high pin count devices in up to eight contact sites in parallel.
26th May 2010

Multitest’s MT9928 Platform Provides the Best ROI Combined with the Highest Efficiency

Multitest’s MT9928 Platform Provides the Best ROI Combined with the Highest Efficiency
Multitest announces that its next-generation MT9928 bowl feed module has successfully passed the strict QA and production approval requirements of an international IDM. The state-of-the-art gravity feed handler offers a variety of loading and un-loading options. With a throughput of up to 14,500 uph, the bowl feed loading module is the loading option of choice for small package sizes.
20th May 2010

Streamlined Spares Support ― Multitest Introduces e.services to Optimize Spare Parts Processing

Multitest introduces e.services, the new online tool created to significantly save costs and time in spare parts processing. The easy-to-use online service allows users to minimize efforts for spare parts in both the operation and purchasing departments. Additionally, the online tool makes all related information readily available and easy to find.
20th May 2010


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