Temperature uniformity system on show at APEX 2017
This year’s IPC APEX EXPO will also see Akrometrix exhibiting in booth 704, at the event taking place 14th-16th February in San Diego. The company will demonstrate its next-generation Shadow Moiré System – the AXP 2.0.
Akrometrix has been supplying thermal warpage systems for more than 20 years utilising the shadow moiré technique. This next-generation AXP system provides unparalleled warpage metrology with lateral/top-bottom temperature uniformity.
AXP 2.0 has optional modules for both DIC strain/CTE measurements and DFP for discontinuous surfaces. Utilising a novel combination of both top and bottom heaters with shadow moiré, Akrometrix is providing temperature uniformity previously unattainable in the industry on a flexible/configurable platform.
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