Armstrong Optical to welcome measurement questions at exhibition
4th September 2008
Source:
Armstrong Optical Ltd
Armstrong Optical has announced that it will be attending the forthcoming Photonex 2008 and Machine Vision and Imaging Sciences exhibitions taking place at Stoneleigh Park, Coventry in mid-October.
Armstrong will be displaying systems for the non-contact measurement of shape/form, flatness, roughness, micro-topography, thickness, distance, vibration and temperature and, in addition, a range of optical components and assemblies for wavelengths from the uv to the far-IR.
The company has said it will be available at the shows to discuss non-contact optical metrology applications and will do its utmost to achieve the exacting price/performance requirements now demanded by potential customers.
It is well known that many manufacturing industries are looking to move high-performance, high-resolution measurements out of the QA laboratory onto the production line and Armstrong believe that they are well placed to offer not only OEM sensor solutions but complete turn-key packages for a variety of applications.
The company has said it will be available at the shows to discuss non-contact optical metrology applications and will do its utmost to achieve the exacting price/performance requirements now demanded by potential customers.
It is well known that many manufacturing industries are looking to move high-performance, high-resolution measurements out of the QA laboratory onto the production line and Armstrong believe that they are well placed to offer not only OEM sensor solutions but complete turn-key packages for a variety of applications.
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