Armstrong Optical to welcome measurement questions at exhibition

Armstrong will be displaying systems for the non-contact measurement of shape/form, flatness, roughness, micro-topography, thickness, distance, vibration and temperature and, in addition, a range of optical components and assemblies for wavelengths from the uv to the far-IR.

The company has said it will be available at the shows to discuss non-contact optical metrology applications and will do its utmost to achieve the exacting price/performance requirements now demanded by potential customers.

It is well known that many manufacturing industries are looking to move high-performance, high-resolution measurements out of the QA laboratory onto the production line and Armstrong believe that they are well placed to offer not only OEM sensor solutions but complete turn-key packages for a variety of applications.