Keithley Instruments GmbH

Commonly defined as the controlled heating and cooling of metals to change their microstructure and mechanical characteristics, such as hardness, ductility, tensile strength and impact resistance, heat treatment is a core phase in many manufacturing processes. It enables engineers to vary the properties of a given material to optimise its design performance and ensure consistent, reliable results. In this country, the top heat treatment technologies tend to be standard hardening, tempering, carburising, induction hardening and annealing processes, whereas in the States, where the industry is valued in excess of $20 billion, isothermal treatments like Austempering and, to a lesser extent, Martempering are much higher on the agenda. So are British design engineers and manufacturers losing out by not embracing these technologies?

Keithley Instruments, Inc. will be showcasing its expertise in RF/Wireless test at European Microwave Week (EuMW), Stand #327C. EuMW takes place in Rome, Italy, from September 28 – October 1, 2009.

Keithley Instruments, Inc. a world leader in advanced electrical test instruments and systems, will broadcast a free webinar titled “Understanding MIMO Channel Sounding” on Thursday, September 24, 2009. This one-hour web-based seminar will introduce the topic of MIMO channel sounding as it relates to characterizing a real-world MIMO wireless channel, which can be used in RF testing of a device by applying channel emulation. To register for this event, visit http://event.on24.com/r.htm?e=161538&s=1&k=36EA7DA283CEA8332DE1D73E097C5B19

Keithley Instruments has enhanced its popular ACS Basic Edition software, adding support for a broader line of source-measure (SMU) instrumentation. This broader choice of compatible instruments should prove especially useful in expanding the software’s voltage and current limits available for testing solar cells, photovoltaic panels, and discrete power semiconductors. ACS Basic Edition combines high speed hardware control, device connectivity, and data management into an easy-to-use tool optimized for part verification, debugging, and analysis.

Keithley Instruments, Inc will be presenting a two-hour workshop entitled “LTE testing – understanding how your LTE radio is performing” on the first day of European Microwave Week (EuMW), which takes place in Rome, Italy, from September 29 to October 1, 2009. Attendance at the workshop is free of charge, but registration is required. For further details and to register, visit http://www.keithley.eu.com/art_resource.php?sid=kquj.2dfmrki.

Keithley Instruments, Inc. has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. “Simplify Your Solar Cell Testing with Keithley’s Precision Measurement Solutions” describes Keithley’s high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also describes key solar cell parameters and measurement techniques. To visit this microsite, go to www.keithley.com/solar_cell.

Keithley Instruments has announced an expansion of its Series 3700 System Switch/Multimeter and plug-in card family with the addition of a new plug-in switching card, the Model 3731 6´16 High Speed, Reed Relay, Matrix Card. Its voltage and current characteristics (200V, 1A switched or 2A carry signal capacity) make it ideal for use in multi-channel I-V testing in conjunction with Keithley's Series 2600A System SourceMeter instruments.

Keithley Instruments, Inc. today announced the addition of a Web-browser-based, multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter family. This new data visualization capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data vs. time as channel measurements are made with the optional built-in digital multimeter, without the need for programming or any data file manipulation.

During the Femtocells World Summit 2009 in London, June 23 – 25, 2009, representatives from Keithley Instruments are on hand to demonstrate the Keithley-ACE Solution manufacturing test solution for femtocells based on the picoChip PC202 Integrated Baseband Processor and the PC205 High Performance Integrated PHY Processor.

Keithley Instruments, Inc. announced today that it has upgraded its popular RF Vector Signal Analyzer line with new capabilities that reduce signal acquisition and measurement times. The new Model 2820A RF Vector Signal Analyzer, which provides a 40MHz signal acquisition bandwidth with a frequency range of either 400MHz–4GHz or 400MHz–6GHz, builds on the capabilities of Keithley’s Series 2800 signal analyzer line. It expands the line’s applications for testing wireless devices to today’s high throughput, complex modulation, and wide bandwidth wireless telecom standards.

Keithley Instruments, Inc. introduces the Model 2891-IQ Upconverter, which provides comprehensive support for transceiver testing by processing analog I and Q baseband signals for testing a transceiver’s transmitter, as well as processing analog I and Q output signals for testing a transceiver’s receiver.

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Keithley Instruments, Inc. will broadcast a free, web-based seminar titled “Photovoltaic Measurements: Testing the Electrical Properties of Today’s Solar Cells.” It will be broadcast on Wednesday, May 27. This one-hour seminar will provide an overview of the electrical measurements used in photovoltaic device development from basic research to early production testing.

Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2009 second quarter ended March 31, 2009.

Keithley Instruments, Inc is launching a European City Seminar Tour starting on April 23, 2009. The tour will visit 22 European cities in Belgium, France, Germany, Italy, The Netherlands, Sweden, Switzerland, and the UK throughout April and May. Attendance is free of charge but registration is required. To see detailed local seminar information and to register, visit www.keithley.info/cityseminars09.

Keithley Instruments, Inc. has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor in-dustry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support. It also addresses the emerging market forces that are shaping the test solutions Keithley is offering the industry, including the rising demand for non-volatile memory, larger data sets, increased device reliability testing, the interest in power conversion/efficiency devices, and the test requirements associated with new semiconductor materials.

Keithley Instruments, Inc. has introduced the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current Voltage (I V), Capacitance Voltage (C V), and pulsed I V testing connections from any modern semiconductor parameter analyzer to a Cascade Microtech or SUSS MicroTec prober. The cables are designed for compatibility with Keithley’s Model 4200 SCS Semiconductor Characterization System, as well as with other test instruments used for characterization.

Keithley Instruments, Inc. will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing.

Keithley Instruments, Inc. is offering a 20% discount off the list price on a range of world-class Test & Measurement instruments to its European customers. The offer is available for a limited period of time, starting with immediate effect and ending on May 31, 2009.

Keithley Instruments, Inc. will broadcast a free, web-based seminar titled “Hall Effect Measurements Fundamentals” on Thursday, February 19, 2009. This one-hour seminar will introduce the topic of Hall Effect measurements as they relate to semiconductor materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.