Keithley White Paper Describes Semiconductor Characterization and Parametric Test Challenges

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24th March 2009

Source: Keithley Instruments GmbH

Keithley Instruments, Inc. has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor in-dustry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support. It also addresses the emerging market forces that are shaping the test solutions Keithley is offering the industry, including the rising demand for non-volatile memory, larger data sets, increased device reliability testing, the interest in power conversion/efficiency devices, and the test requirements associated with new semiconductor materials.

The white paper also describes Keithley’s leading solutions for these semiconductor test challenges, including:

• Series 2600A System SourceMeter® Instruments
• Model 4200-SCS Semiconductor Characterization Systems
• Automated Characterization Suite (ACS) Systems
• Other high-speed, high-accuracy instruments

Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis. Its products range from benchtop instruments to turn-key systems and are used in applications as diverse as materials analysis, device characterization, wafer level reliability, and process control monitoring. Keithley works closely with semiconductor customers worldwide through its network of field service centers and application engineers who have specific expertise in the area of semiconductor technology.
For more information, contact the company at: www.keithley.com.

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