Thermal Imaging for Academic Research

13th July 2015
Posted By : Jacqueline Regnier
Thermal Imaging for Academic Research

FLIR Systems announces that it will be showing its latest thermal imaging solutions for academic research at Photonex 2015* on 14th and 15th October 2015. 

On display on Stand E03 will be the FLIR X6580sc - an ultra-fast frame-rate camera much favoured by leading academic research groups looking to capture data from the most fleeting of thermal events.

This high performance camera features a 640 × 512 digital InSb detector with spectral sensitivity from 1.5 to 5.5 µm and an f/3 aperture. It provides top quality images up to 355 Hz in full frame and up to 4011 Hz in a 64 × 8 sub windowing mode. Features on the X6580sc include unmatched thermal sensitivity, snapshot imagery, a motorised spectral filter wheel and a detachable touchscreen LCD. The camera connects to the company’s ResearchIR Max R&D software to provide comprehensive thermal imaging data acquisition, analysis and reporting capabilities. The X6580sc can be temperature-calibrated up to 300 °C, or up to 3000 °C with spectral and/or neutral density filters, and it provides measurement accuracy of ±1 °C for standard configurations.


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