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Machine learning capability enables correlative microscopy datasets

Machine learning capability enables correlative microscopy datasets
The recently announced ZEISS ZEN Intellesis, a new machine learning capability from ZEISS enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine microscopy user. ZEISS ZEN Intellesis software is available for the company’s full range of optical, confocal, X-ray, electron and ion microscopes.
14th March 2018


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