Atomic force microscope boasts fast scan rates

Posted By : Mick Elliott
Atomic force microscope boasts fast scan rates

An ultrafast-scanning 9500 atomic force microscope has been unveiled by Keysight Technologies. The Keysight 9500 AFM system integrates new software, a new high-bandwidth digital controller, and a state-of-the-art mechanical design to provide scan rates of up to 2s/frame (256x256 pixels).

Engineered with scientific and industrial R&D users in mind, the 9500 covers an expansive range of advanced AFM applications associated with materials science, life science, polymer science and electrical characterisation.

The ultrafast scan rates of the 9500 atomic force microscope are made possible by Keysight’s new Quick Scan technology. Available as a system option, Quick Scan is controlled through NanoNavigator, a powerful new imaging and analysis software package from Keysight.

In addition to supporting Quick Scan functionality, NanoNavigator software lets researchers save time by using a new Auto Drive feature that automatically and optimally sets all parameters for the 9500.

The software’s efficient workflow-based GUI guides users step-by-step through system setup and operation via intuitive, eye-catching visuals. A mobile app for smart phones and tablets allows remote monitoring of AFM experiments while they are being performed by the 9500.

The system offers a large (90µm) closed-loop AFM scanner with atomic resolution, industry-leading environmental control, ultra-high-precision temperature control, and much more. The 9500 delivers superior imaging in fluids, gases, and ambient conditions.

Researchers also can use the 9500 to perform single-pass nanoscale electrical characterisation. A new high-bandwidth, FPGA-based digital controller ensures high-speed operating precision and eliminates the requirement for additional external control boxes.

The compact mechanical design of the 9500 affords researchers quick and convenient access to their samples. More than a half-dozen of the most commonly used AFM imaging modes (including Keysight’s patented MAC Mode) are supported by the system’s standard nose cone, which can easily be interchanged with specialized nose cones as needed, extending the 9500’s capabilities effortlessly. Keysight also offers an STM scanner for studies of conducting materials and an ILM system for simultaneous AFM/optical imaging.

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