MIRTEC, “The Global Leader in Inspection Technology,” announces that it has been awarded a 2010 Global Technology Award in the category of AOI Inspection Systems for its MV-7xi In-Line AOI System configured with MIRTEC’s exclusive 15M Pixel ISIS Vision System. This prestigious award was presented to Brian D’Amico, President of MIRTEC’s North American Sales and Service Division, on Tuesday, October 26, 2010 at a ceremony that took place during the SMTA International exhibition held at the Walt Disney World Swan and Dolphin Resort in Orlando, FL.
EC’s all new MV-7xi system uses a state-of-the-art 15M Pixel top-down camera system, known as ISIS (Infinitely Scalable Imaging Sensor). This is a proprietary camera system designed and manufactured by MIRTEC for use with its complete range of inspection equipment.
ISIS is the industry’s first optics system fully capable of addressing a diverse range of inspection requirements with a single state-of-the-art camera system. By changing the magnification of the Precision Telecentric Lens, the resolution of the optics system may be scaled from 18.2 microns/pixel with an incredibly large FOV of 70.6 x 70.6mm, ideal for extremely high-speed manufacturing; down to 5 microns/pixel with an FOV of approximately 19.4 x 19.4mm, which is suitable for high-end micro-electronics manufacturing. Fully configured, the new MIRTEC MV-7xi features four Fifteen Mega Pixel side-view cameras in addition to the top-down camera, as well as MIRTEC’s revolutionary Intelli-Scan Laser System.
We are extremely proud to receive the 2010 Global Technology Award for our MV-7xi In-Line AOI System, said D’Amico. At APEX 2010, MIRTEC rocked the inspection industry with the unveiling of our 15M pixel ISIS Vision System. Since then, we also have developed a 10M pixel variant of the ISIS product line, allowing us to address a more budget conscious consumer while still providing twice the native resolution of our nearest competitors,” D’Amico added. “We are confident that this ground-breaking technology will not only bring unprecedented speed and performance to the electronics inspection industry, but will undoubtedly set a new standard by which all other inspection equipment will be measured.”