Kester’s Peter Biocca to Chair AOI and X-Ray Inspection Technical Session at SMTAI 2010

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5th October 2010

Source: Kester, Inc

Kester’s Peter Biocca to Chair AOI and X-Ray Inspection Technical Session at SMTAI 2010

Kester announces that Peter Biocca, Senior Market Development Engineer, will Co-Chair Session PRC2, titled “Strategies for Optimizing AOI and X-Ray Inspection” at the upcoming SMTA International, scheduled to take place October 24 - 28, 2010 at the Walt Disney World Swan and Dolphin Resort in Orlando, FL. The session will take place Wednesday, October 27, 2010 from 10:30 a.m.-12 p.m. in room Europe 1.

With increasing PCBA density and package complexity, reliance on AOI and X-Ray inspection to enable PCBA quality continues to grow. Strategies for optimal AOI and X-Ray application are necessary to ensure that defects are detected at the most opportunistic time with the smallest cost impact and defect escape risk.

During this session, real world users outline strategies and studies that show how to minimize defect escapes while balancing efficient utilization of inspection equipment.

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