Altus now presenting Nikon Metrology’s innovations

One such solution available from Altus is Nikon Metrology’s XT V 160, a high-precision, flat-panel-based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.

Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this inspection system offers improved feature recognition. As such, the XT V 160 NF is well-suited for development in the production environment. 

Richard Booth, Altus Managing Director said: “There has been growing interest in X-ray and CT inspection equipment as the need for more powerful measurement techniques increases to analyse ever more densely populated circuit boards. We believe that systems like those from Nikon Metrology will become more and more popular as the need to undertake inspection in a non-destructive manner is ever more important as the popularity of microelectronics increases.”

Booth added: “Nikon Metrology’s range of equipment is a welcome addition to our extensive product portfolio and we look forward to a long and successful relationship with them.”